A Partitioning Technique for Reducing the Computational Complexity of the Test generation and Probabilistic Detection of Faults in Combinational Circuits

Faculty of Engineering

Assiut University

A Partitioning Technique for Reducing the Computational Complexity of the Test generation and Probabilistic Detection of Faults in Combinational Circuits

Research Authors
S. A. Ali
Research Member
Samia Abd El-Fattah Ali Hassan
Research Department
Electrical Engineering Department
Research Year
1992
Research Journal
International Journal of Electronics
Research Vol
Vol. 73, No. 6
Research Rank
1
Research_Pages
pp. 1301-1319