Yellow rust (stripe rust), caused by Puccinia striiformis
f. sp. tritici, is one of the most destructive foliar diseases
of wheat in Egypt and worldwide. In order to identify
wheat genotypes resistant to yellow rust and develop
molecular markers associated with the resistance, fifty
F8 recombinant inbred lines (RILs) derived from a
cross between resistant and susceptible bread wheat
landraces were obtained. Artificial infection of Puccinia
striiformis was performed under greenhouse conditions
during two growing seasons and relative resistance index
(RRI) was calculated. Two Egyptian bread wheat
cultivars i.e. Giza-168 (resistant) and Sakha-69 (susceptible)
were also evaluated. RRI values of two-year trial
showed that 10 RILs responded with RRI value >6 <9
with an average of 7.29, which exceeded the Egyptian
bread wheat cultivar Giza-168 (5.58). Thirty three RILs
were included among the acceptable range having RRI
value >2 <6. However, only 7 RILs showed RRI value
<2. Five RILs expressed hypersensitive type of resistance
(R) against the pathogen and showed the lowest
Average Coefficient of Infection (ACI). Bulked segregant
analysis (BSA) with eight simple sequence repeat
(SSR), eight sequence-related amplified polymorphism
(SRAP) and sixteen random amplified polymorphic
DNA (RAPD) markers revealed that three SSR, three
SRAP and six RAPD markers were found to be associated
with the resistance to yellow rust. However, further
molecular analyses would be performed to confirm
markers associated with the resistance and suitable for
marker-assisted selection. Resistant RILs identified in
the study could be efficiently used to improve the resistance
to yellow rust in wheat.