The effect of Al, Ag and Cr metal electrodes on the electrical properties of Ce---Se---Te films was studied. The relative ease of the diffusion of metallic atoms and the accompanied tendency to nucleation leads to irreversible changes of the film resistivity while annealing. The recrystallization temperature of the chalcogenide film depends strongly on the type of the metal electrode. The observed increase in the values of resistivity after annealing, was interpreted on the basis of charged dangling bond theory