Research Abstract
Amorphous Gex Se90-x Sb10 thin films were prepared by thermal evaporation under vacuum onto glass substrates. Reflectance and transmittance were measured in the wavelength range 190-900 nm. The optical properties of the as deposited and UV-irradiated films at different exposure times were reported. The compositional dependence of the optical constants (absorption coefficient, the non-direct optical gap Eg, refractive index (n), and the extinction coefficient (k) were evaluated and discussed in terms of the Ge content and the chemical bond network model.
Research Department
Research Journal
Journal of Advanced Thermal Science Research
Research Member
Research Vol
2
Research Year
2015