Thermally induced phase transformations in chalcogenide thin films evaporated from the alloy As 36-Te 53-Ge 11 (wt.%) onto glass substrates kept at room temperature were investigated using transmission electron microscopy. Although the as-deposited films showed an amorphous structure, a sudden and very fast transformation to a crystalline phase took place dendritically on electron-beam heating in the microscope. Annealing of thin films outside the microscope in the temperature range 100–170 °C was also found to cause and assist dendritic recrystallization. This formation of dendrites is discussed in terms of the properties of the material
Research Abstract
Research Department
Research Journal
Thin Solid Films
Research Member
Research Rank
2
Research Vol
Vol. 60, No. 3
Research Year
1979
Research Pages
pp. 371-376